Научная электронная библиотека ULRICH'S Periodicals Directory

Сибирский государственный университет
науки и технологий имени академика М.Ф. Решетнева

Сибирский аэрокосмический журнал
ISSN 2712-8970 (Print) ISSN 2782-5760 (on-line)

Сведения об образовательной организации

UDK 629.7.018.4
TESTING ELECTRONIC PARTS FROM FLIGHT LOTS ON DOSE EFFECTS FOR THE HARDNESS GUARANTEE OF SPACECRAFT ONBOARD EQUIPMENT
V. M. Zykov1, Yu. V. Maximov2, I. A. Maximov2, S. G. Kochura2, V. V. Ivanov2, A. V. Patskov2*
1National Research Tomsk Polytechnic University 30, Lenin Av., Tomsk, 634050, Russian Federation 2JSC “Information satellite systems” named after academician M. F. Reshetnev” 52, Lenin St., Zheleznogorsk, 662972, Russian Federation *E-mail: patskov@iss-reshetnev.ru
The main results for radiation testing electronic parts of flight lots on dose effects of long-time low-intensive influ-ence of space ionizing radiation is observed. Such test approach provides for the given component a computational-experimental radiation design margin estimation, which is based on part's experimental radiation hardness determina-tion at the stage of the spacecraft onboard equipment acquisition. The test complex includes two Co-60 panoramic gamma apparatuses with adjustment of gamma-radiation dose rate in a range from 0,1 rad/s to 0,01 rad/s, and a do-simetry system for calibration of a gamma-radiation field in terms of the dose absorbed in silicon with uncertainty no more than 2,5 %. The results of testing bipolar parts manufactured in Russia have shown that as the dose rate decreases, radiation hardness depending on the change in the dose rate may either increase or decrease. Incidental uncontrollable changes in the production technologies of parts occurring within a period of time less than a year and causing changes in radiation hardness of parts on dose effects to an order of magnitude are found out. If the absorbed dose is less 30 krad for bipolar parts the dose rate effect can be found out on the basis of a higher recovery rate of parts parameters after irradiation at high dose rate in the course of the subsequent annealing at room or raised to 100 °С temperature. It is shown that under the conditions of the time-varying dose rate that models aftereffects of high-power Sun flash, the bipolar parts characterized by the effect opposite to ELDRS, temporary parametric failure is detected. The discovered dose effects are offered to be taken into consideration when updating the standard test methods.
Keywords: onboard equipment, spacecraft, electronic parts, flight lots, radiation test.
References

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Zykov Vladimir Mikhailovich – Dr. Sc., Physical methods and quality control department, senior research officer, National Research Tomsk Polytechnic University. E-mail: vmz@tpu.ru.

Maximov Yuriy Viktorovich – postgraduate, deputy general director for quality, JSC “Information Satellite Systems” named after academician M. F. Reshetnev”. E-mail: qmaximov@iss-reshetnev.ru.

Maximov Igor Aleksandrovich – Dr. Sc., head of department, JSC “Information satellite systems” named after academician M. F. Reshetnev”. E-mail: maximov@iss-reshetnev.ru.

Kochura Sergey Grigor’evich – Cand. Sc., Docent, JSC “Information Satellite Systems” named after academician M. F. Reshetnev”, deputy general designer of electrical engineering and control systems of spacecraft. E-mail: kochura@iss-reshetnev.ru.

Ivanov Vladimir Vasil’evich – Cand. Sc., JSC “Information Satellite Systems” named after academician M. F. Reshetnev”, deputy head of department. E-mail: ivanov@iss-reshetnev.ru.

Patskov Andrey Vladimirovich – postgraduate, engineer of department, JSC “Information Satellite Systems” named after academician M. F. Reshetnev”. E-mail: patskov@iss-reshetnev.ru.